Dimension Icon
Najważniejsze informacje
Dimension Icon
布鲁克’s Dimension Icon®brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours.
Cechy Charakterystyczne
最高绩效和分辨率
The superior resolution of the Dimension Icon, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is a culmination of Bruker's industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in XY. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of high-resolution AFMs. The new design of the XYZ closed-loop head also delivers higher scan speed, without loss of image quality, to enable greater throughput for data collection. Bruker-exclusive峰值攻击®使尺寸图标常规创建最高分辨率图像。
出色的生产率
维度的afm使得更多的出版ished data than any other large-sample AFM platform, gaining an iconic reputation in both research and industry in the process. The Icon takes the platform to a new level of excellence, providing higher performance and faster results. The software’s intuitive workflow makes performing even the most advanced AFM techniques much easier than ever before. Icon users achieve immediate high-quality results without the usual hours of expert tweaking. Every facet of the Dimension Icon — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free operation and surprising AFM ease of use.
Maximum Flexibility
The Icon system delivers uncompromised performance, robustness, and flexibility to perform nearly every measurement at scales previously obtained by extensively customized systems. Utilizing an open-access platform, large- or multiple-sample holders, and numerous ease-of-use features, it opens up the power of AFM to research and industry alike, setting a new standard for high-quality AFM imaging and nanomanipulation.
Dimension Icon delivers flexibility without any impact to performance -- one platform, endless possibilites:
- Modify platform to correlate additional techniques
- Easily tailor your studies with open-access software and hardware -- “If it doesn’t exist, invent it”
- 完整的电池，有机太阳能以及其他解决方案
aplikacje
Expand Your Applications with AFM Modes
Bruker拥有无与伦比的成像模式的套件，为每项调查提供了AFM技术。
Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
Dimension Icon Data Gallery
阿克索里亚
Webinary
Recent AFM Webinars
引用
听听我们的客户要说的话
布鲁克’s Dimension Icon is the most customizable and flexible AFM on the planet. The Dimension Icon has enabled key advances in our lab, namely the development of surface voltage microscopy and elucidation of charge transfer dynamics that are at the heart of photoanodes for solar fuel. And along the way we could always count on excellent support from Bruker’s advanced applications team.
The Bruker Icon AFM system was installed two years ago in our clean room facility, [where it was] revealed as a unique instrument for its capability to perform low-noise and high-resolution imaging for many users, on many kind of samples and with reliable performances! ScanAsyst mode preserves the AFM probes in good condition for weeks and allows any student to be independent and to start the measurements after a short training. We are very satisfied!
我们的尺寸图标系统的新的多功能原子力显微镜揭示了纳米级表面特征和地形，例如粘附和模量及其扫描仪和峰值QMM。通过合并导电和KPFM函数，可以观察到界面连接和设备特性，从而帮助我们了解有关剖面形态和界面状态的更多详细信息。此外，图标的高速和可靠性提供了快速的过程检查和分析。
